• DocumentCode
    2680941
  • Title

    Reaction sequence of thin ni films with [001] 3C-SiC

  • Author

    Gasser, S.M. ; Bachli, A. ; Kolawa, E. ; Nicolet, M.A.

  • Author_Institution
    California Institute of Technology
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    191
  • Lastpage
    191
  • Keywords
    Annealing; Backscatter; Chemical elements; Mass spectroscopy; Microstructure; Nickel; Phase detection; Silicon carbide; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887570
  • Filename
    887570