• DocumentCode
    2680976
  • Title

    Solid state reactions and barrier properties of the thin films Ti-W on the silicon

  • Author

    Makogon, Yu.N. ; Maximovich, L.P. ; Sidorenko, S.I.

  • Author_Institution
    National Technic Univercity of Ukraine "Kyiv Polytechnical Institute"
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    198
  • Lastpage
    198
  • Keywords
    Aluminum; Annealing; Heat treatment; Physics; Semiconductor thin films; Silicon; Solid state circuits; Sputtering; Temperature distribution; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887573
  • Filename
    887573