DocumentCode
2680976
Title
Solid state reactions and barrier properties of the thin films Ti-W on the silicon
Author
Makogon, Yu.N. ; Maximovich, L.P. ; Sidorenko, S.I.
Author_Institution
National Technic Univercity of Ukraine "Kyiv Polytechnical Institute"
fYear
1997
fDate
16-19 March 1997
Firstpage
198
Lastpage
198
Keywords
Aluminum; Annealing; Heat treatment; Physics; Semiconductor thin films; Silicon; Solid state circuits; Sputtering; Temperature distribution; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location
Villard de Lans, France
ISSN
1266-0167
Type
conf
DOI
10.1109/MAM.1998.887573
Filename
887573
Link To Document