• DocumentCode
    2681227
  • Title

    Timing ECO optimization via Bézier curve smoothing and fixability identification

  • Author

    Chang, Hua-Yu ; Jiang, Iris Hui-Ru ; Chang, Yao-Wen

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    742
  • Lastpage
    746
  • Abstract
    Due to the rapidly increasing design complexity in modern IC design, more and more timing failures are detected at late stages. Without deferring time-to-market, metal-only ECO is an economical technique to correct these late-found failures. Typically, a design undergoes many ECO runs in design houses; the usage of spare cells is of significant importance. Hence, in this paper, we aim at timing ECO using the least number of spare cells. We observe that a path with good timing is desired to be geometrically smooth. Different from negative slack and gate delay used in most of prior work, we propose a new metric of timing criticality - fixability - considering the smoothness of critical paths. To measure the smoothness of a path, we use Bézier curve as the golden path. Furthermore, in order to concurrently fix timing violations, we derive the dominance property to divide violated paths into independent segments. Based on Bézier curve smoothing, fixability identification, and the dominance property, we develop an efficient algorithm to fix violations. Compared with the state-of-the-art works, experimental results show that our algorithm not only effectively resolves all timing violations with few spare cells but also achieves 22.8X and 42.6X speedups.
  • Keywords
    circuit optimisation; integrated circuit design; timing; Bezier curve smoothing; design complexity; dominance property; fixability identification; modern IC design; spare cells; timing ECO optimization; timing criticality; timing failure; timing violations; Delay; Design automation; Loading; Logic gates; Optimization; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105412
  • Filename
    6105412