DocumentCode :
2681322
Title :
FCL application issues in Korean electric power grid
Author :
Lee, Soo-Hoan ; Lee, Kang-Wan ; Yoon, Yong-Beum ; Hyun, Ok-Bae
Author_Institution :
Korea Electr. Power Corp., Seoul
fYear :
0
fDate :
0-0 0
Abstract :
We present the analysis on 3 current-limiting practices, a bus-bar split, installation of a current limiting reactor (CLR), and application of a fault current limiter (FCL) in the KEPCO´s 345 kV power grid. The 345 kV trunk T/Ls are suffering from the high fault currents. Circuit breaker replacements are currently being practiced in many substations. As alternative ways of fault current control, application of the three current-limiting practices has been investigated. All 3 practices limit the fault currents effectively, but they create unexpected problems when coupled with the grid. The concomitant phenomena associated with the current-limiting measures such as transient stability, critical fault clearance time, and power transfer limit have been investigated and compared. The comparison in their performances shows that an FCL is the most favorable and the bus-split the least favorable solution to control fault current. But, its feasibility needs more studies
Keywords :
circuit breakers; current limiting reactors; fault current limiters; power grids; power transmission faults; power transmission protection; KEPCO; Korean electric power grid; bus-bar split; circuit breaker replacements; concomitant phenomena; critical fault clearance time; current limiting reactor; current-limiting practices; fault current control; fault current limiter; power transfer limit; transient stability; Circuit breakers; Coupling circuits; Current limiters; Current measurement; Fault current limiters; Fault currents; Inductors; Power grids; Power systems; Substations; (superconducting) fault current limiter; critical fault clearance time; current limiting reactor; fault current; power transfer limit; transient stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2006. IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0493-2
Type :
conf
DOI :
10.1109/PES.2006.1709426
Filename :
1709426
Link To Document :
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