DocumentCode :
268134
Title :
On the Interplay Between Microstructure and Interfaces in High-Efficiency Microcrystalline Silicon Solar Cells
Author :
Hänni, Simon ; Alexander, D.T.L. ; Ding, L. ; Bugnon, G. ; Boccard, M. ; Battaglia, C. ; Cuony, P. ; Escarré, J. ; Parascandolo, G. ; Nicolay, S. ; Cantoni, M. ; Despeisse, M. ; Meillaud, F. ; Ballif, C.
Author_Institution :
Lab. of Photovoltaics & Thin Film Electron., Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
Volume :
3
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
11
Lastpage :
16
Abstract :
This paper gives new insights into the role of both the microstructure and the interfaces in microcrystalline silicon (μc-Si) single-junction solar cells. A 3-D tomographic reconstruction of a μc-Si solar cell reveals the 2-D nature of the porous zones, which can be present within the absorber layer. Tomography thus appears as a valuable technique to provide insights into the μc-Si microstructure. Variable illumination measurements enable to study the negative impact of such porous zones on solar cells performance. The influence of such defective material can be mitigated by suitable cell design, as discussed here. Finally, a hydrogen plasma cell post-deposition treatment is demonstrated to improve solar cells performance, especially on rough superstrates, enabling us to reach an outstanding 10.9% efficiency microcrystalline single-junction solar cell.
Keywords :
crystal microstructure; elemental semiconductors; silicon; solar cells; tomography; 2D nature; 3D tomographic reconstruction; Si; absorber layer; cell design; defective material; high-efficiency microcrystalline silicon solar cells; hydrogen plasma cell post-deposition treatment; microcrystalline silicon single-junction solar cells; microcrystalline-Si microstructure; porous zones; rough superstrates; solar cell performance; tomography; variable illumination measurements; Microstructure; Photovoltaic cells; Photovoltaic systems; Plasmas; Silicon; Tomography; Zinc oxide; High efficiency; microcrystalline silicon (μc-Si); thin-film solar cells; tomography;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2012.2214766
Filename :
6302160
Link To Document :
بازگشت