Title :
Benefit of Selective Emitters for p-Type Silicon Solar Cells With Passivated Surfaces
Author :
Jäger, Ulrich ; Mack, S. ; Wufka, C. ; Wolf, Alon ; Biro, Daniel ; Preu, Ralf
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst., Freiburg, Germany
Abstract :
We compare homogeneous and selective emitters on monocrystalline silicon solar cells with passivated surfaces and present an analysis of the saturation current densities influencing the open-circuit voltage VOC and the fill factor FF . The cells´ surfaces are passivated by a thin thermal oxide. Selective emitters are fabricated by laser doping from phosphosilicate glass. On both Czochralski-grown silicon (Cz-Si) as well as float zone silicon (FZ-Si), we find higher conversion efficiencies for the cells featuring a selective emitter. An efficiency up to 20.0% is reported on FZ-Si with an area of 148.4 cm2 . For the selective emitter cells, 8 mV higher open-circuit voltages are found compared with the baseline. A saturation current analysis reveals that these cells exhibit a lower diode saturation current density of ideality 2 (J02), as well as improved shielding of the minorities in the emitter from the front contact. The selective emitter cells show a minor loss in short-circuit current density JSC of 0.5 %rel due to the presence of highly doped, illuminated areas. Front contact quality of the cells featuring a selective emitter is found to be superior compared with the cells with a homogeneously doped emitter.
Keywords :
crystal growth from melt; current density; elemental semiconductors; passivation; semiconductor doping; short-circuit currents; silicon; solar cells; zone melting; Czochralski-grown silicon; Si; conversion efficiency; diode saturation current density; doped illuminated areas; fill factor; float zone silicon; front contact quality; homogeneous emitters; laser doping; monocrystalline silicon solar cells; open-circuit voltage; p-type silicon solar cells; passivated surface; phosphosilicate glass; selective emitter cells; shielding; short-circuit current density; thin thermal oxide; Current density; Doping; Electrical resistance measurement; Loss measurement; Photovoltaic cells; Resistance; Silicon; Laser doping; passivated emitter and rear cell; selective emitter; silicon solar cell;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2012.2230685