DocumentCode :
2682165
Title :
Augmenting sequence constraints in Z and its application to testing
Author :
Tsai, W.T. ; Agarwal, Vishal ; Huang, Baisu ; Paul, Raymond
Author_Institution :
Dept. of Comput. Sci. & Eng., Minnesota Univ., Minneapolis, MN, USA
fYear :
2000
fDate :
2000
Firstpage :
41
Lastpage :
48
Abstract :
The paper introduces sequence constraints into a formal specification language Z. Formal specification languages have been used to specify safety-critical applications, and many static and dynamic aspects of the system can be specified. However, the method calling constraints, a runtime behavior, are often missed. The paper introduces two kinds of sequence constraints: those constraints with respect to a schema and those with respect to multiple schemas. Once sequence constraints are specified, together with parameter specifications already in Z, one can generate test cases including test inputs and their expected outputs using various testing strategies such as partition testing, boundary testing, random testing, stress testing, and negative testing. An application has been specified in Z using sequence constraints, and test cases generated have been used to test the software. The results show that the test cases generated successfully detected all the faults seeded
Keywords :
formal specification; program testing; safety-critical software; specification languages; Z sequence constraints; boundary testing; dynamic aspects; expected outputs; formal specification language; multiple schemas; negative testing; parameter specifications; partition testing; random testing; runtime behavior; safety-critical applications; sequence constraints; stress testing; test cases; test inputs; testing application; testing strategies; Application software; Computer science; Electrical capacitance tomography; Formal specifications; Mission critical systems; Runtime; Safety; Specification languages; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Application-Specific Systems and Software Engineering Technology, 2000. Proceedings. 3rd IEEE Symposium on
Conference_Location :
Richardson, TX
Print_ISBN :
0-7695-0559-7
Type :
conf
DOI :
10.1109/ASSET.2000.888030
Filename :
888030
Link To Document :
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