Title :
Equivalence class verification and oracle-free testing using two-layer covering arrays
Author :
Kuhn, D. Richard ; Kacker, Raghu N. ; Yu Lei ; Torres-Jimenez, Jose
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
This short paper introduces a method for verifying equivalence classes for module/unit testing. This is achieved using a two-layer covering array, in which some or all values of a primary covering array represent equivalence classes. A second layer covering array of the equivalence class values is computed, and its values substituted for the equivalence class names in the primary array. It is shown that this method can detect certain classes of errors without a conventional test oracle, and an illustrative example is given.
Keywords :
program testing; program verification; equivalence class verification; module testing; oracle-free testing; primary covering array; two-layer covering array; two-layer covering arrays; unit testing; Access control; Containers; Fault detection; Impedance matching; Indexes; Standards; Testing; combinatorial testing; factor covering array; oracle problem; t-way testing; verification and validation (V&V);
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location :
Graz
DOI :
10.1109/ICSTW.2015.7107445