Title :
Tversky´s Parameterized Similarity Ratio Model: A Basis for Semantic Relatedness
Author_Institution :
Dept. of Comput. Sci. & Syst. Anal., Miami Univ., Oxford, OH
Abstract :
Numerous measures have been proposed to determine the semantic relatedness between words. Earlier approaches rely on the location of the words within the structure of a terminological ontology and are categorized into distance-based or information content models. More recently research has considered the overlapping of attributes or relationships, i.e., feature matching, between words or lexical concepts. This paper focuses on Tversky´s prominent parameterized ratio model and its fundamental role in semantic relatedness measures. Existing semantic relatedness measures from the distance-based and information content categories are unified through this model. Through appropriate feature selection of properties of word objects in terminological ontologies, the model may also be used as the basis for proposing numerous other approaches to creating a variety of semantic relatedness measures
Keywords :
feature extraction; natural language processing; nomenclature; ontologies (artificial intelligence); word processing; feature matching; feature selection; information content categories; information content models; parameterized similarity ratio model; semantic relatedness measures; terminological ontology; Artificial intelligence; Computer science; Data mining; Electronic switching systems; History; Information retrieval; Machine assisted indexing; Natural language processing; Ontologies; Psychology;
Conference_Titel :
Fuzzy Information Processing Society, 2006. NAFIPS 2006. Annual meeting of the North American
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0363-4
Electronic_ISBN :
1-4244-0363-4
DOI :
10.1109/NAFIPS.2006.365467