• DocumentCode
    2682831
  • Title

    Shear strength and interfacial microstructures of low-Ag SAC/Cu and SAC-Bi-Ni/Cu solder joints

  • Author

    Liu, Yang ; Sun, Fenglian ; Zou, Pengfei

  • Author_Institution
    Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    186
  • Lastpage
    189
  • Abstract
    Recently, the development of low-Ag Sn-Ag-Cu (SAC) solders has become a new research field in electronic packaging industry because of the braze reliability and cost concerns. In this study, the shear strength and interfacial microstructures of two kinds of low-Ag solder joints, SAC/Cu and SAC-Bi-Ni/Cu, were investigated. The results obtained affirmed that the addition of Ni and Bi in low-Ag SAC0705 solder improves the shear strength of the solder joints and decreases the fracture ductility of the alloy. With 3.5% Bi and 0.1% Ni addition, the shear strength increases from 11.09MPa to 19.51MPa. For low-Ag solder joints investigated in this research, the shear dimples mostly appear at the interface between bulk solder and interfacial IMC.
  • Keywords
    bismuth alloys; copper alloys; electronics packaging; nickel alloys; shear strength; silver alloys; solders; tin alloys; Sn-Ag-Cu-Cu; bulk solder; electronic packaging industry; interfacial intermetallic compounds; interfacial microstructures; pressure 11.09 MPa to 19.51 MPa; shear strength; solder joints; Bismuth; Copper; Materials; Nickel; Reliability; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials (APM), 2011 International Symposium on
  • Conference_Location
    Xiamen
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4673-0148-0
  • Type

    conf

  • DOI
    10.1109/ISAPM.2011.6105696
  • Filename
    6105696