An approach of mission completion success probability prediction for circuits based on Saber simulation

To solve problems existing in the static fault simulation method, the dynamic one is proposed in this paper, and based on it, an approach of predicting mission completion success probability for circuits is proposed. In this approach, the failure distributions of components are derived from Reliability Prediction Handbook for Electronic Equipment, and the sampling algorithm is introduced to simulate the randomness of failure modes and fault occurring time. Moreover, this approach introduces looping fault simulation and automatic fault judgment techniques to simulate large numbers of tests to predict mission completion success probability for circuits. For the realization of this approach in Saber simulation software, this paper presents automatic fault injection based on MAST models of Saber components and automatic fault judgment techniques in the circuit simulation process, and predicts the mission completion success probability for a representative example with Saber based on the approach.