DocumentCode :
2683022
Title :
A method of unsensitizable path identification using high level design information
Author :
Ohtake, Satoshi ; Ikeda, Naotsugu ; Inoue, Michiko ; Fujiwara, Hideo
Author_Institution :
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
fYear :
2010
fDate :
23-25 March 2010
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes a method of unsensitizable path identification. By dealing with untestable paths in sequential circuits at register-transfer level (RTL) and utilizing design information obtained from high-level synthesis, the method can identify sequentially unsensitizable paths effectively and efficiently. Information about identified unsensitizable paths can not only facilitate process of test generation but also mitigate futileness of testing. In this work, we employ non-robust unsensitizability, which is widely supported in current ATPG systems, for identifying unsensitizable paths. We show the effectiveness of use of high-level design information through our experiments using RTL circuits synthesized from behavioral benchmark circuits.
Keywords :
automatic test pattern generation; high level synthesis; integrated circuit testing; sequential circuits; ATPG system; RTL circuits; behavioral benchmark circuit; high-level design; high-level synthesis; nonrobust unsensitizability; register-transfer level; sequential circuit; test generation; unsensitizable path identification; untestable path; Circuit faults; Circuit synthesis; Circuit testing; Delay; Fault diagnosis; High level synthesis; Paper technology; Registers; Sequential circuits; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4244-6338-1
Type :
conf
DOI :
10.1109/DTIS.2010.5487557
Filename :
5487557
Link To Document :
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