DocumentCode
2683121
Title
The multiple-arc analysis for dielectric dispersions
Author
Al-Refaie, S.N.
Author_Institution
Yarmouk Univ., Irbid, Jordan
fYear
2000
fDate
2000
Firstpage
177
Lastpage
181
Abstract
The multiple-arc approach is used to investigate the dispersion of an InP-oxide thin film. The method is applied in conjunction with a tunneling model to reveal a distribution of states at the interfacial region. The method is also employed to develop an equivalent circuit for the oxide dielectric whereby overlapping arcs introduced negative impedance converters in the network
Keywords
dielectric relaxation; dielectric thin films; equivalent circuits; interface states; negative impedance convertors; permittivity; tunnelling; InP; dielectric dispersions; equivalent circuit; interface states; multiple-arc analysis; negative impedance converters; overlapping arcs; oxide dielectric; oxide thin film; tunneling model;
fLanguage
English
Publisher
iet
Conference_Titel
Dielectric Materials, Measurements and Applications, 2000. Eighth International Conference on (IEE Conf. Publ. No. 473)
Conference_Location
Edinburgh
Print_ISBN
0-85296-730-6
Type
conf
DOI
10.1049/cp:20000500
Filename
888109
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