DocumentCode :
268314
Title :
Electron Temperature Evolution in a Low-Pressure Dusty RF Nitrogen-Rich Methane Plasma
Author :
Massereau-Guilbaud, Véronique ; Geraud-Grenier, Isabelle ; Lagrange, J. ; Tawidian, Hagop ; Mikikian, Maxime
Author_Institution :
Groupe de Rech. Sur l´Energetique des Milieux Ionises, Univ. d´Orleans, Bourges, France
Volume :
41
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
816
Lastpage :
821
Abstract :
Particles are generated in a classical planar RF (13.56-MHz) reactor in nitrogen-rich methane at low pressure (120 Pa). The gas decomposition leads to particle generation and growth. During their formation, the particles become negatively charged. The electrical and the optical parameters of the discharge are disturbed. The presence of particles in the plasma is put in evidence by laser light scattering and is correlated to the DC self-bias voltage. A small quantity of argon is introduced in the gas mixture in order to estimate the electron temperature. The temporal evolutions of both the electron temperature and the optical emission intensities of excited argon are correlated with the particle growth and behavior in the plasma.
Keywords :
argon; decomposition; discharges (electric); dusty plasmas; gas mixtures; light scattering; nitrogen compounds; plasma chemistry; plasma diagnostics; plasma light propagation; plasma pressure; plasma production; plasma temperature; Ar; DC self-bias voltage; N; argon excitation; classical planar RF reactor; discharge electrical parameters; discharge optical parameters; electron temperature evolution; frequency 13.56 MHz; gas decomposition; gas mixture; laser light scattering; low-pressure dusty RF nitrogen-rich methane plasma; negatively charge particle; optical emission intensities; particle generation; particle growth; pressure 120 Pa; Argon; Discharges (electric); Electrodes; Light scattering; Plasma temperature; Radio frequency; Dust particle growth; dusty plasma; plasma diagnostics;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2252025
Filename :
6495579
Link To Document :
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