• DocumentCode
    2683151
  • Title

    Electromagnetic induced heating for rapid thermal cycling of single SnAgCu solder joint in double substrates

  • Author

    Chen, Jibing ; An, Bing ; Li, Cong ; Guo, Wei ; Wu, Yiping

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    129
  • Lastpage
    133
  • Abstract
    The thermal fatigue behavior of the solder joint treated by electromagnetic induced heating is investigated in the present study. The microstructures and compositions of solder joints were observed and analyzed by scanning electron microscopy (SEM) and energy dispersive X-ray system (EDXS) respectively. An approach to rapid thermal cycles by high-frequency electromagnetic induction heating was also presented in terms of numerical simulation. It was found that rapid thermal cycle has an evident influence on the microstructure and IMC between SAC305 solder and Cu substrate. The results showed that there is a rimous cracks phenomenon in the microstructure of the solder balls after rapid thermal cycle. The results indicate that this method by local induction heating is feasible to investigate the thermal fatigue behaviors of solder joint. This method can also effectively improve the reliability of the electronic packaging devices.
  • Keywords
    electromagnetic induction; electronics packaging; rapid thermal processing; scanning electron microscopy; solders; thermal stress cracking; EDXS; SEM; double substrates; electromagnetic induction heating; electronic packaging; energy dispersive X-ray system; rapid thermal cycling; scanning electron microscopy; solder joint; thermal fatigue behavior; Copper; Electromagnetic heating; Fatigue; Soldering; Substrates; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials (APM), 2011 International Symposium on
  • Conference_Location
    Xiamen
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4673-0148-0
  • Type

    conf

  • DOI
    10.1109/ISAPM.2011.6105712
  • Filename
    6105712