DocumentCode :
2683201
Title :
Design trade-offs in high performance packages
Author :
Kadakia, Suresh D. ; Agrawal, Amit P.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1996
fDate :
28-31 May 1996
Firstpage :
645
Lastpage :
651
Abstract :
The objective of this paper is to focus on design considerations and on design methodology for high performance packages. Discussion will be restricted to Single Chip Packages only. Wirebond and Flip chip packages in Pin Grid and Ball Grid I/Os are described here. As shown here design considerations are primarily driven by customer input followed by electrical modeling and process modeling to guarantee performance and cost. The electrical performance of the package is analyzed by evaluating the parasitic parameters
Keywords :
design engineering; flip-chip devices; integrated circuit packaging; lead bonding; 50 MHz; ball grid I/Os; cross talk; delta-I noise; design; electrical modeling; electrical performance; flip chip packages; high performance packages; impedance; parasitic parameters; pin grid I/Os; power loop inductance; process modeling; single chip packages; wirebond packages; Boundary conditions; Costs; Delay; Design methodology; Electronics packaging; Flip chip; Frequency; Impedance; Inductance; Performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-3286-5
Type :
conf
DOI :
10.1109/ECTC.1996.517454
Filename :
517454
Link To Document :
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