DocumentCode
2683442
Title
Finite element simulation of thermal properties of 40Si-Al alloys for electronics packaging
Author
Wei, Shen ; Yu-ping, Pu ; Peng, Zhao ; Li-ran, Zhu
Author_Institution
Central Iron & Steel Res. Inst., Beijing, China
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
149
Lastpage
153
Abstract
Due to lighter, stiffer and offer superior heat-sinking than traditional packaging materials, Si-Al alloys have been proved as novel materials used for packaging microwave hybrid circuitry. In the current paper, finite element geometric models based on the real microstructural images of 40Si-Al are generated. Furthermore, based on Fourier´s law for heat conduction and thermal expansion equation, thermal properties including the thermal conductivity and the coefficient of thermal expansion (CTE) of 40Si-Al are quantified by finite element method (FEM). By means of statistical method in conjunction with FEM results, the thermal conductivity and CTE at room temperature are calculated, respectively. The numerical simulation result agrees with the corresponding experimental result, which shows that the methodology developed in this paper is efficient in calculating thermal properties of Si-Al alloys.
Keywords
aluminium alloys; crystal microstructure; finite element analysis; heat conduction; silicon alloys; thermal conductivity; thermal expansion; Fourier´s law; SiAl; finite element method; heat conduction; microstructure; thermal conductivity; thermal expansion coefficient; thermal properties; Conductivity; Electronic packaging thermal management; Finite element methods; Silicon; Temperature; Thermal conductivity; 40Si-Al; CTE; FEM; thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials (APM), 2011 International Symposium on
Conference_Location
Xiamen
ISSN
1550-5723
Print_ISBN
978-1-4673-0148-0
Type
conf
DOI
10.1109/ISAPM.2011.6105729
Filename
6105729
Link To Document