DocumentCode
2683694
Title
An Improved Model for Short- and Open-Circuited Series Stubs in Fin Lines
Author
Burton, M. ; Hoefer, W.J.R.
fYear
1984
fDate
May 30 1984-June 1 1984
Firstpage
330
Lastpage
332
Abstract
This paper presents empirical closed-form expressions for the scattering parameters of series stubs in single-ridge, unilateral fin line with narrow gap width. These expressions show the effect of fin gap width, stub length, and frequency and are suitable for computer-aided design.
Keywords
Connectors; Design automation; Distributed parameter circuits; Equivalent circuits; Frequency; Scattering parameters; Testing; Thickness measurement; Transmission line discontinuities; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1984.1131781
Filename
1131781
Link To Document