Realization of principle of Fourier holographic processing in multifrequency measurements in range 126.6-145.4 GHz

Spectral analysis of complex reflection coefficient measured at many frequencies in wide band is powerful tool of diagnostics and non-destructive testing of dielectric structures. This approach is similar to time pulse probing. Widening of frequency band gives possibility of synthesizing shorter pulses thus structures with less thickness can be tested. For this purpose millimeter wave range is more preferable than centimeter range. In the latter range phase measurements can be realized as by means of signal transformation to lower frequencies with phase measurements at low frequencies as by means of 6-port reflectometer conception application