• DocumentCode
    26841
  • Title

    An Efficient Technique to Protect Serial Shift Registers Against Soft Errors

  • Author

    Reviriego, Pedro ; Ruano, Oscar ; Flanagan, Mark F. ; Pontarelli, Salvatore ; Maestro, Juan Antonio

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • Volume
    60
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    512
  • Lastpage
    516
  • Abstract
    This brief presents a technique to efficiently correct single soft errors in serial shift registers. The proposed scheme uses two copies of the shift register. To achieve error correction, data are convolutionally encoded at the input of one of the copies and are decoded at its output. This processing ensures that in that copy, any error affecting a single bit will corrupt its output for multiple cycles. On the other hand, a single-bit error in the original copy will corrupt its output only for one cycle. Therefore, the error patterns can be used to identify the copy that has suffered the error and, consequently, to correct the error. The proposed technique has been implemented in a Hardware Description Language and implemented in a 45-nm library. A fault injection tool has been used to evaluate the effectiveness of the proposed scheme, showing that it can correct all single soft errors. The cost of the proposed approach in terms of circuit area has been compared with a traditional triple-modular redundancy implementation. The results show significant cost reductions, which approach a factor of 33% for large shift registers.
  • Keywords
    error statistics; hardware description languages; shift registers; circuit area; convolutional encoding; cost reductions; decoding; fault injection tool; hardware description language; serial shift register protection; single soft errors; single-bit error; size 45 nm; soft errors; triple-modular redundancy implementation; Clocks; Convolutional codes; Delay lines; Logic gates; Shift registers; Tunneling magnetoresistance; Delay lines; modular redundancy; shift registers; soft errors;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2013.2268346
  • Filename
    6553611