• DocumentCode
    2684280
  • Title

    Development of molded fine-pitch ball grid array (FPBGA) using through-hole bonding process

  • Author

    Matsuda, Shuichi ; Kata, Keiichiro ; Nakajima, Hirofiuni ; Hagimoto, Eiji

  • Author_Institution
    VLSI Package Dev. Dept., NEC Corp., Kanagawa, Japan
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    727
  • Lastpage
    732
  • Abstract
    A molded fine-pitch ball grid array (FPBGA) structure, consisting of the fabricated chip, carrier tape, molded resin, and solder bumps, has many advantages over conventional structures for chip-scale packages. The assembly process of FPBGA consists of through-hole bonding, lamination, molding, solder bump formation, and outline cutting. The bonding process, which is called through-hole bonding, does not have lead bending or wire or lead crossing and allows a finer chip pad pitch to be used. However, since it is difficult to evaluate the bonding strength of each part, unlike wire bonding or TAB inner lead bonding, we developed several methods for evaluating the through-hole bonding. In the fabrication of molded FPBGA, the back side of the chip is molded by resin, which improves the robustness of the package. In this process, it is important to keep coplanarity of the package surface. We are currently testing the reliability of the molded FPBGA and results are good
  • Keywords
    fine-pitch technology; integrated circuit packaging; integrated circuit reliability; lead bonding; microassembling; plastic packaging; soldering; FPBGA structure; assembly process; ball grid array; carrier tape; lamination; molded fine-pitch BGA package; molded resin; outline cutting; reliability; solder bump formation; through-hole bonding process; Assembly; Bonding processes; Chip scale packaging; Electronics packaging; Fabrication; Lamination; Lead; Resins; Robustness; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.517465
  • Filename
    517465