Title :
AC effects in IC reliability
Author_Institution :
University of California
Keywords :
Circuit stability; Degradation; Digital circuits; Electric breakdown; Electromigration; Electrons; MOSFET circuits; Safety; Stress; Voltage;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888175
