DocumentCode :
2684490
Title :
HMIC 3-D chipscale, surface mount devices
Author :
Boles, T. ; Brogle, J. ; Rozbicki, A.
Author_Institution :
M/A-COM Technol. Solutions, Lowell, MA, USA
fYear :
2011
fDate :
7-9 Nov. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Broadband components continue have the basic issues of fundamental high frequency performance and unit-to-unit reproducibility. While possible solutions to these two basic problems exist, it is universally acknowledged that both the basic semiconductor performance at frequencies above 10 GHz and the unit variation are severely limited by packaging, die attach, and chip and wire assembly techniques. The purpose of this paper is to present a unique, fundamentally different approach to the packaging and monolithic integration of ultra wideband switches which not only includes the electrical input/output but also device thermal heat sinking. This method is based upon a technology, HMIC, which utilizes standard semiconductor wafer scale processes to realize the final monolithic, surface mountable element, in this case a single pole four throw multi octave switch.
Keywords :
chip scale packaging; heat sinks; microwave integrated circuits; surface mount technology; switches; three-dimensional integrated circuits; ultra wideband technology; HMIC 3D chipscale; broadband components; chip assembly technique; device thermal heat sinking; die attach; fundamental high-frequency performance; monolithic element; monolithic integration; multioctave switch; packaging; semiconductor performance; standard semiconductor wafer scale processes; surface mount devices; ultrawideband switches; unit-to-unit reproducibility; wire assembly technique; Insertion loss; Microwave circuits; Microwave integrated circuits; Microwave transistors; Radio frequency; Surface impedance; Glass Technology; Integrated Circuits; PIN Diode Switches; Surface Mount Packaging; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
Type :
conf
DOI :
10.1109/COMCAS.2011.6105782
Filename :
6105782
Link To Document :
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