• DocumentCode
    2684501
  • Title

    The Infinite Hidden Markov Random Field Model Based on Student´s t-Distribution

  • Author

    Xiong, Taisong ; Yi, Zhang

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2012
  • fDate
    27-29 Oct. 2012
  • Firstpage
    567
  • Lastpage
    574
  • Abstract
    Hidden Markov Random Field (HMRF) models are important statistical tools for image segmentation. However, such models cannot automatically determine the number of clusters. In many practical applications, to determine the number of clusters in advance is impossible. The Dirichlet process mixture (DPM) models are nonparametric Bayesian models which can automatically determine the number of clusters for the clustering problem. A new HMRF model which combines the DPM model with Student´s t-distribution is proposed in this paper. Compared to the Gaussian distribution, the Student´s t-distribution with heavier-tailed can have more applications. This model can automatically determine the appropriate clustering number from the observed data. In addition, an efficient variational Bayesian inference algorithm is derived to the proposed model. Experimental results show that the proposed model outperforms other DPM-based models in image segmentation.
  • Keywords
    Bayes methods; hidden Markov models; image segmentation; pattern clustering; random processes; statistical distributions; Dirichlet process mixture model; clustering problem; image segmentation; infinite hidden Markov random field model; nonparametric Bayesian model; statistical tool; student t-distribution; variational Bayesian inference algorithm; Approximation methods; Bayesian methods; Computational modeling; Data models; Gaussian distribution; Hidden Markov models; Image segmentation; Dirichlet process; Hidden Markov Random Field; Image segmentation; Variational Bayesian inference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology (CIT), 2012 IEEE 12th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4673-4873-7
  • Type

    conf

  • DOI
    10.1109/CIT.2012.122
  • Filename
    6391960