Title :
Power distribution network analysis in Deep Submicron Designs
Author :
Sofer, Sergey ; Berkovitz, Asher ; Neiman, Valery
Author_Institution :
Freescale Semicond. Israel Ltd., Herzelia, Israel
Abstract :
Described an importance, complexity and limitations of power distribution network analysis in Deep Submicron Designs. Proposed a three-stage way of Power Integrity (PI) checks to account for standard PI tools´ capacity limitation of on-die short and high time resolution and die + package long and low time resolution PI analysis.
Keywords :
circuit complexity; integrated circuit interconnections; nanoelectronics; power supplies to apparatus; deep submicron design; high time resolution; power distribution network analysis; power integrity check; standard PI tool capacity limitation; time resolution PI analysis; Capacitance; Power demand; Power grids; Power system dynamics; System-on-a-chip; Vectors; Power Consumption; Power Distribution Network; Power Integrity; Voltage Droop;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
DOI :
10.1109/COMCAS.2011.6105788
