Title :
Comprehensive physical modeling of NMOSFET hot-carrier-induced degradation
Author :
Lunenborg, M.M. ; de Graaff, H.C. ; Mouthaan, A.J. ; Verweij, J.F.
Author_Institution :
University of Twente
Keywords :
CMOS technology; Charge pumps; Circuit simulation; Degradation; Hot carriers; Interface states; MOSFET circuits; Predictive models; Semiconductor device modeling; Stress;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888187
