• DocumentCode
    2684677
  • Title

    Full wave modeling of RF propagation between low-to-the-ground antennas

  • Author

    Wu, K. ; Schuster, J.W. ; Luebbers, R.J.

  • Author_Institution
    Remcom Inc., State College, PA, USA
  • fYear
    2005
  • fDate
    3-8 July 2005
  • Firstpage
    711
  • Abstract
    Recently, there has been a great deal of interest in unattended ground sensors (UGS) for remote monitoring applications. Since the antennas are located near the ground, interaction between the RF signal and the terrain can significantly affect the propagation of the signal. Some of these effects include multiple scattering and backscattering from the roughness of the terrain surface, blockage of the signal by obstructions on the propagation path, and coupling to ground wave modes. In addition, the ground in the near field can also significantly affect the radiation pattern of the antenna. We have applied the moving window finite difference time domain (MWFDTD) method to study near-the-surface propagation. The MWFDTD model is based on the full-wave finite difference time domain (FDTD) method. In this paper we demonstrate the utility of MWFDTD for modeling the propagation of RF signals from very-near-the-ground antennas located over rough terrain surfaces.
  • Keywords
    UHF radio propagation; antenna radiation patterns; backscatter; electromagnetic wave scattering; finite difference time-domain analysis; monitoring; rough surfaces; MWFDTD model; RF propagation; UGS; backscattering; full wave modeling; low-to-the-ground antennas; moving window finite difference time domain method; multiple scattering; near field; radiation pattern; remote monitoring; rough terrain surfaces; unattended ground sensors; Antennas and propagation; Backscatter; Finite difference methods; RF signals; Radio frequency; Remote monitoring; Rough surfaces; Scattering; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2005 IEEE
  • Print_ISBN
    0-7803-8883-6
  • Type

    conf

  • DOI
    10.1109/APS.2005.1552114
  • Filename
    1552114