DocumentCode :
2684732
Title :
Dielectric Properties of Millimeter Wave Materials
Author :
Afsar, M.N. ; Button, K.J.
fYear :
1984
fDate :
May 30 1984-June 1 1984
Firstpage :
522
Lastpage :
524
Abstract :
It is no longer necessary to use extrapolated microwave dielectric values when designing millimeter wave components, devices and systems. We are now furnishing highly accurate millimeter wave (5 mm to 1/2 mm) data on complex dielectric permittivity and loss tangent to engineers for a variety of materials such as common ceramics, semiconductors, crystalline and glass materials. For most materials the dielectric loss increases with frequency in the millimeter, unlike the microwave, is an important feature of our new data. Reliable measurements also reveal that the method of Preparation of nominally identical specimens can change the dielectric losses by many factors.
Keywords :
Crystalline materials; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric materials; Microwave devices; Millimeter wave devices; Millimeter wave technology; Permittivity; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1984.1131848
Filename :
1131848
Link To Document :
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