Title :
Dielectric Properties of Millimeter Wave Materials
Author :
Afsar, M.N. ; Button, K.J.
fDate :
May 30 1984-June 1 1984
Abstract :
It is no longer necessary to use extrapolated microwave dielectric values when designing millimeter wave components, devices and systems. We are now furnishing highly accurate millimeter wave (5 mm to 1/2 mm) data on complex dielectric permittivity and loss tangent to engineers for a variety of materials such as common ceramics, semiconductors, crystalline and glass materials. For most materials the dielectric loss increases with frequency in the millimeter, unlike the microwave, is an important feature of our new data. Reliable measurements also reveal that the method of Preparation of nominally identical specimens can change the dielectric losses by many factors.
Keywords :
Crystalline materials; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric materials; Microwave devices; Millimeter wave devices; Millimeter wave technology; Permittivity; Semiconductor materials;
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/MWSYM.1984.1131848