DocumentCode
2684735
Title
Study of the soft leakage current induced ESD on LDD transistor
Author
Wada, Tetsuaki
Author_Institution
Matsushita Electronics Corporation
fYear
1996
fDate
1996
Firstpage
1707
Lastpage
1710
Keywords
Circuit testing; Electronic equipment testing; Electrostatic discharge; Leakage current; MOSFETs; Protection; Semiconductor device testing; Temperature; Transistors; Variable structure systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888197
Filename
888197
Link To Document