• DocumentCode
    2684753
  • Title

    Preliminary considerations and experiments to obtain higher brightness and pulsed ion beams with bunch

  • Author

    Kasuya, K. ; Horioka, Kazuhiko ; Saito, Yuya ; Aso, Teruo ; Iida, Hiroyuki ; Matsuura, Nobuyoshi ; Goino ; Kato, Shigeo

  • fYear
    1990
  • fDate
    21-23 May 1990
  • Firstpage
    161
  • Lastpage
    162
  • Abstract
    Summary form only given. One of the important issues concerning intense pulsed ion beams for inertial confinement fusion compared with lasers is to obtain higher ion beam brightness. It is hoped that bunching the beams during beam transport can be used to achieve still higher brightness of the beams. To bunch the beams, focusing-type ion diodes without turn-on delay times, large current channels to transport focused ion beams, and pulsed power generators to supply high voltage to the ion diodes are required. Accordingly, a pulsed ion source was operated with an active anode, and a small channel to be assembled together with the cryogenic ion diode was designed. The particle distributions within the ion diode, which had a substantial effect on the characteristics of the beam focusing and the beam transport, were measured. To extract ion beams without turn-on delay times and to exclude the disturbances from neutral particles, an advanced version of the active anode diode was developed. Plasma injected by a flashboard from behind the anode before the diode´s main high-voltage pulse were used as the ion source
  • Keywords
    beam handling techniques; fusion reactor theory and design; ion beams; active anode; active anode diode; brightness; bunch; cryogenic ion diode; focused ion beams; focusing-type ion diodes; high voltage; high-voltage pulse; inertial confinement fusion; ion diodes; large current channels; neutral particles; pulsed ion beams; pulsed power generators; transport; turn-on delay times;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1990. IEEE Conference Record - Abstracts., 1990 IEEE International Conference on
  • Conference_Location
    Oakland, CA, USA
  • Type

    conf

  • DOI
    10.1109/PLASMA.1990.110714
  • Filename
    5725986