DocumentCode
2684783
Title
Pulsed thermal characterization of a reverse biased pn-junction for ESD HBM simulation
Author
Wolf, H. ; Gieser, H. ; Wilkening, W.
Author_Institution
Technische Universitat Munchen
fYear
1996
fDate
1996
Firstpage
1711
Lastpage
1714
Keywords
Avalanche breakdown; Calibration; Circuit simulation; Computational modeling; Diodes; Electric variables measurement; Electrostatic discharge; Pulse measurements; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888198
Filename
888198
Link To Document