2684800

Justifications for reducing HBM and MM ESD qualification test time

Verhaege, K. ; Robinson-Hahn, D. ; Russ, C. ; Farris, M. ; Scanlon, J. ; LIN, D. ; Veltri, J. ; Groenseneken, G.

Lucent Technologies

1996

1996

1715

1718

Digital integrated circuits; Electrostatic discharge; Integrated circuit testing; Life testing; Manufacturing; Pins; Qualifications; Stress; System testing; Voltage;

English

ieee

Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on

0-7803-3369-1

conf

10.1109/ESREF.1996.888199

888199