DocumentCode
2684800
Title
Justifications for reducing HBM and MM ESD qualification test time
Author
Verhaege, K. ; Robinson-Hahn, D. ; Russ, C. ; Farris, M. ; Scanlon, J. ; LIN, D. ; Veltri, J. ; Groenseneken, G.
Author_Institution
Lucent Technologies
fYear
1996
fDate
1996
Firstpage
1715
Lastpage
1718
Keywords
Digital integrated circuits; Electrostatic discharge; Integrated circuit testing; Life testing; Manufacturing; Pins; Qualifications; Stress; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888199
Filename
888199
Link To Document