DocumentCode :
2684819
Title :
Reproducibility of field failures by ESD models - comparison of HBM, socketed CDM and non-socketed CDM
Author :
Broddeck, T. ; Bauch, H. ; Guggenmos, X. ; Wagner, R.
Author_Institution :
SIEMENS AG
fYear :
1996
fDate :
1996
Firstpage :
1719
Lastpage :
1722
Keywords :
Biological system modeling; Circuit testing; Electrostatic discharge; Failure analysis; Integrated circuit modeling; Microcontrollers; Production; Protection; Reproducibility of results; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888200
Filename :
888200
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2684819
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