DocumentCode
2684819
Title
Reproducibility of field failures by ESD models - comparison of HBM, socketed CDM and non-socketed CDM
Author
Broddeck, T. ; Bauch, H. ; Guggenmos, X. ; Wagner, R.
Author_Institution
SIEMENS AG
fYear
1996
fDate
1996
Firstpage
1719
Lastpage
1722
Keywords
Biological system modeling; Circuit testing; Electrostatic discharge; Failure analysis; Integrated circuit modeling; Microcontrollers; Production; Protection; Reproducibility of results; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888200
Filename
888200
Link To Document