Title :
Simulation study for the CDM ESD behaviour of the grounded-gate NMOS
Author :
Russ, C. ; Verhaege, K. ; Bock, K. ; Groeseneken, G.E. ; Maes, H.E.
Author_Institution :
IMEC
Keywords :
Automatic testing; Biological system modeling; Bipolar transistors; Delay effects; Electrostatic discharge; Humans; MOS devices; Power dissipation; Protection; Thermal stresses;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888205
