Title :
Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors
Author :
Wouters, D.J. ; Maes, H.E.
Author_Institution :
IMEC
Keywords :
Capacitors; Degradation; Electrodes; Fatigue; Ferroelectric films; Ferroelectric materials; Hysteresis; Nonvolatile memory; Polarization; Read-write memory;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888211
