Title :
A Dual Six-Port Automatic Network Analyzer and its Performance Tests
Author :
Nak Sam Chung ; Jeong Hwan Kim ; Joon Shin
fDate :
May 30 1984-June 1 1984
Abstract :
A computer controlled six-port ANA(Automatic Network Analyzer) capable of measuring complex reflection coefficients of one-port devices, effective efficiencies of power sensors, and S-parameters of two-port devices over 2-18 GHz is described. System calibration, based on the TRL technique is discussed and performance tests on measuring reflection coefficient and S-parameters are summarized.
Keywords :
Automatic control; Automatic testing; Calibration; Computer networks; Performance analysis; Power measurement; Reflection; Scattering parameters; Sensor phenomena and characterization; System testing;
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/MWSYM.1984.1131864
