• DocumentCode
    2685092
  • Title

    Reliability of a focused ion beam repair on digital CMOS circuits

  • Author

    Van Camp, R. ; Van Doorselaer, K. ; Clemminck, I.

  • Author_Institution
    Alcatel Telecom Antwerp
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    1787
  • Lastpage
    1790
  • Keywords
    CMOS digital integrated circuits; CMOS technology; Circuit testing; Clocks; Degradation; Electromigration; Integrated circuit interconnections; Ion beams; Prototypes; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
  • Print_ISBN
    0-7803-3369-1
  • Type

    conf

  • DOI
    10.1109/ESREF.1996.888216
  • Filename
    888216
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2685092