Title :
Improved critical area prediction by application of pattern recognition techniques
Author :
Mattick, J.H.N. ; Kelsall, R.W. ; Miles, R.E.
Author_Institution :
University of Leeds
Keywords :
Atmospheric modeling; Circuit testing; Equations; Metallization; Pattern analysis; Pattern recognition; Predictive models; Robustness; Shape; Topology;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888222
