DocumentCode :
2685170
Title :
Method for precise determination of the statistical distribution of the input offset voltage of differential stages
Author :
Thewes, R. ; Schindhelm, T. ; Tiebout, M. ; Wohlrab, E. ; Kollmer, U. ; Kessel, S. ; Schmitt-Landsiedel, Doris ; Weber, W.
Author_Institution :
Siemens Corporate R&D
fYear :
1996
fDate :
1996
Firstpage :
1823
Lastpage :
1826
Keywords :
Analog circuits; Circuit testing; Coupling circuits; Design optimization; Differential amplifiers; Operational amplifiers; Research and development; Statistical distributions; Tellurium; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888224
Filename :
888224
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2685170
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