• DocumentCode
    2685210
  • Title

    Quality and reliability improvement through defect oriented failure analysis

  • Author

    De Pauw, P. ; Van Haeverbeke, S.

  • Author_Institution
    Alcatel Mietec
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    1835
  • Lastpage
    1838
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Electronics industry; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Integrated circuit yield; Microscopy; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
  • Print_ISBN
    0-7803-3369-1
  • Type

    conf

  • DOI
    10.1109/ESREF.1996.888227
  • Filename
    888227
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2685210