Title :
Quality and reliability improvement through defect oriented failure analysis
Author :
De Pauw, P. ; Van Haeverbeke, S.
Author_Institution :
Alcatel Mietec
Keywords :
Automatic testing; Circuit faults; Circuit testing; Electronics industry; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Integrated circuit yield; Microscopy; Test pattern generators;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888227
