DocumentCode :
2685241
Title :
The method to quickly stimulate the storage failure mode of the repairable products
Author :
Zhao, Shuaishuai ; Yao, Jun ; Zhou, Xiufeng
Author_Institution :
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear :
2011
fDate :
12-15 June 2011
Firstpage :
966
Lastpage :
969
Abstract :
The determination of the weak parts is always depended on the engineering experience, the limited test of the similar products, the inadequate failure data during use or the related references. It is lack of a guidance method to determine the weak links. For this problem, this article proposes a high-efficiency method to stimulate the failure mode of the repairable products in the storage period. Referring to reliability enhancement testing and environment stress screening, we establish the principle to determine the test profile, which is based on the analysis of the potential failure mode and mechanism. This method can quickly divulge the weak parts and provide guidance for accelerated test.
Keywords :
maintenance engineering; mechanical testing; reliability; storage; stress analysis; environment stress screening; high-efficiency method; reliability enhancement testing; repairable products; storage failure mode; weak links; Humidity; Life estimation; Missiles; Reliability; Stress; Temperature; Thermal stresses; Failure mode; environment stress screening; failure mechanism; reliability enhancement testing; weak parts;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
Type :
conf
DOI :
10.1109/ICRMS.2011.5979405
Filename :
5979405
Link To Document :
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