DocumentCode :
2685244
Title :
A Study of the Relation Between Device Low-Frequency Noise and Oscillator Phase Noise for GaAs MESFETs
Author :
Rohdin, H. ; Chung-Yi Su ; Stolte, C.
fYear :
1984
fDate :
May 30 1984-June 1 1984
Firstpage :
267
Lastpage :
269
Abstract :
An analytical model for oscillator noise resulting from active device LF noise is presented. We apply it to a number of GaAs MESFET oscillators finding good quantitative agreement, and demonstrating several ways of reducing the phase noise. We show evidence that after having reduced the effect of the normally dominant device LF noise source, a residual LF noise source starts to dominate the phase noise. The best phase noise result for the 5GHz oscillators is S/sub phi/(1kHz) = -75dB/Hz.
Keywords :
Equations; Fluctuations; Frequency measurement; Gallium arsenide; Low-frequency noise; MESFETs; Noise measurement; Oscillators; Phase measurement; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1984.1131877
Filename :
1131877
Link To Document :
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