DocumentCode
2685245
Title
The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability
Author
Witvrow, A. ; Van Dooren, S. ; Wouters, D. ; Van Dievel, M. ; Maex, K.
Author_Institution
IMEC
fYear
1996
fDate
8-11 Oct. 1996
Firstpage
1847
Lastpage
1850
Keywords
Current density; Current measurement; Electrical resistance measurement; Electromigration; Equations; Life estimation; Life testing; Resistors; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Conference_Location
Enschede, The Netherlands
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888229
Filename
888229
Link To Document