DocumentCode :
2685283
Title :
Obtaining patterns for classification of power quality disturbances using biorthogonal wavelets, RMS value and support vector machines
Author :
García, Msc Valdomiro Vega ; Gualdrón, Msc César Antonio Duarte ; Plata, Gabriel Ordóñez
Author_Institution :
Ind. Univ. of Santander - UIS, Bucaramanga
fYear :
2007
fDate :
9-11 Oct. 2007
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes three strategies in order to obtain patterns that allow identification of power quality disturbances. These strategies use Discrete Wavelet Transform (using biorthogonal Wavelet) and RMS value. Disturbances under survey are: low frequency disturbances (such as flicker and harmonics) and high frequency disturbances (such as transient and sags). Due to time-frequency localization properties, Discrete Wavelet Transform permits decomposition of signals in different energy levels, which are used to characterize disturbances that contain information in frequency domain. Four wavelet families were studied and Biorthogonal showed excellent performance. Also, RMS value is used to characterize those disturbances that show big changes in magnitude. The combination of both strategies produces excellent results. Patterns are automatically classified by support vector machines (SVM). Thus, Radial Base Function (RBF) was used as kernel, because RBF requires only two parameters (sigma and C). Cross validation technique and grid search were used in this work. SVM exhibit a good performance as classifier despite similitude between some disturbance patterns.
Keywords :
discrete wavelet transforms; power engineering computing; power supply quality; power system faults; radial basis function networks; support vector machines; RBF; RMS; RMS value; SVM; biorthogonal wavelets; discrete wavelet transform; high frequency disturbances; low frequency disturbances; power quality disturbances; radial base function; support vector machines; time-frequency localization properties; Continuous wavelet transforms; Discrete wavelet transforms; Educational institutions; Electronics industry; Frequency; Industrial electronics; Power quality; Support vector machine classification; Support vector machines; Wavelet analysis; Discrete Wavelet Transform; RBF; RMS; artifitial neural network; biorthogonal wavelet; cross validation; disturbances; monitoring; power quality; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Power Quality and Utilisation, 2007. EPQU 2007. 9th International Conference on
Conference_Location :
Barcelona
Print_ISBN :
978-84-690-9441-9
Electronic_ISBN :
978-84-690-9441-9
Type :
conf
DOI :
10.1109/EPQU.2007.4424102
Filename :
4424102
Link To Document :
بازگشت