Estimation of permitivitty and loss tangent of high frequency materials in the millimeter wave band using a hemispherical open resonator

Author

Felbecker, Robert ; Keusgen, Wilhelm ; Peter, Michael

Author_Institution

Fraunhofer Heinrich Hertz Inst., Berlin, Germany

fYear

2011

fDate

7-9 Nov. 2011

Firstpage

1

Lastpage

8

Abstract

In this paper, a hemispherical open resonator is used to measure the quality factor and resonant frequency of various materials in the millimeter wave band. This measurement method allows us to determine the permittivity and the loss tangent of homogeneous materials. Materials like PTFE, PE and PS were used to validate the measurement system. Finally, we measured the resonant frequency and quality factor of samples of Rogers RO4003C and TMM10, which are up to now only characterized up to 10 GHz.

Keywords

Q-factor; measurement systems; millimetre wave materials; millimetre wave resonators; permittivity measurement; Rogers RO4003C; hemispherical open resonator; high frequency materials; homogeneous materials; loss tangent; measurement method; measurement system; millimeter wave band; permittivity estimation; quality factor; Frequency measurement; Loss measurement; Materials; Permittivity; Permittivity measurement; Q factor; Resonant frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on

Conference_Location

Tel Aviv

Print_ISBN

978-1-4577-1692-8

Type

conf

DOI

10.1109/COMCAS.2011.6105829

Filename

6105829