Title :
Board design considerations for multilane SerDes bench testing
Author :
Rysin, A. ; Michaelov, L. ; Mantel, O. ; Fefer, Y.
Author_Institution :
Freescale Semicond. Israel Ltd., Herzlia, Israel
Abstract :
The considerations and challenges, involved in designing a board for SerDes characterization, are analyzed. Analysis of the sources for the distortion of the signal transmitted through the characterization board, as well as measures to mitigate these sources are proposed.
Keywords :
VLSI; integrated circuit testing; system-on-chip; SerDes characterization; board design considerations; multilane SerDes bench testing; signal distortion; Coaxial cables; Connectors; Distortion; Distortion measurement; Impedance; Microstrip; Transmission line measurements; SerDes; characterization; compliance test; high-speed serial interfaces; printed circuit body; signal integrity;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
DOI :
10.1109/COMCAS.2011.6105830
