DocumentCode
2685325
Title
Board design considerations for multilane SerDes bench testing
Author
Rysin, A. ; Michaelov, L. ; Mantel, O. ; Fefer, Y.
Author_Institution
Freescale Semicond. Israel Ltd., Herzlia, Israel
fYear
2011
fDate
7-9 Nov. 2011
Firstpage
1
Lastpage
6
Abstract
The considerations and challenges, involved in designing a board for SerDes characterization, are analyzed. Analysis of the sources for the distortion of the signal transmitted through the characterization board, as well as measures to mitigate these sources are proposed.
Keywords
VLSI; integrated circuit testing; system-on-chip; SerDes characterization; board design considerations; multilane SerDes bench testing; signal distortion; Coaxial cables; Connectors; Distortion; Distortion measurement; Impedance; Microstrip; Transmission line measurements; SerDes; characterization; compliance test; high-speed serial interfaces; printed circuit body; signal integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location
Tel Aviv
Print_ISBN
978-1-4577-1692-8
Type
conf
DOI
10.1109/COMCAS.2011.6105830
Filename
6105830
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