Title :
Session 23: Microwave and Millimeter-Wave Measurements
fDate :
May 30 1984-June 1 1984
Abstract :
This session covers a wide variety of measurernent topics concerned with microwave and millimeter-waves. Papers will be presented on new methods, techniques and solutions that extend and improve the state of the measurement art.
Keywords :
Dielectric constant; Dielectric materials; Dielectric measurements; Electromagnetic fields; Frequency modulation; Millimeter wave measurements; Noise measurement; Optical fibers; Permittivity measurement; Phase detection;
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/MWSYM.1984.1131883
