Title :
Parallel Transition Localization
Author_Institution :
Agilent Res. Labs., Reno, NV, USA
Abstract :
Microprocessor clock rates-which for three decades doubled about every 18 months-have essentially stopped increasing. Instead the number of processor cores (identical processing units capable of all usual microprocessor functions) in a microprocessor is increasing exponentially with time. In order to increase performance as the number of cores increase, measurement analysis software will have to take advantage of this parallelism. The purpose of this paper is to study one example of a measurement analysis having serial dependencies among the input data and to show that there is a practical parallel algorithm despite the data dependencies within the measured time series. The measurement analysis studied is transition localization in digital signals. A parallel scan-type algorithm is presented. Results of applying the parallel algorithm on both synthetic data and actual measured data are presented, and the speedup obtained on an eight core processor analyzed.
Keywords :
computerised instrumentation; microcomputers; parallel algorithms; parallel processing; time series; measurement analysis software; microprocessor clock rates; parallel algorithm; parallel scan-type algorithm; parallel transition localization; processor cores; time series; Algorithm design and analysis; Clocks; Microprocessors; Parallel algorithms; Performance analysis; Signal analysis; Software measurement; Software performance; Time measurement; Time series analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5487990