Title :
Simulation of the gate burnout of GaAs MESFET
Author :
Vashchenko, V.A. ; Martynov, J B ; Sinkevitch, V.F. ; Tager, A.S.
Author_Institution :
SRI PULSAR
Keywords :
Avalanche breakdown; Electric breakdown; Gallium arsenide; MESFETs; Metallization; Numerical simulation; Optical buffering; Optical microscopy; Pulse measurements; Two dimensional displays;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888238
