DocumentCode :
2685407
Title :
Infrared spectroscopy in failure analysis
Author :
Malmberg, Hans
Author_Institution :
Chem. Anal., Life Time Eng. AB, Karlskoga, Sweden
fYear :
2011
fDate :
12-15 June 2011
Firstpage :
1021
Lastpage :
1025
Abstract :
Functional failures may be related to chemical and/or physical changes in the bulk of a component or at the interface between components. Failure due to contamination also may occur. A vital part of failure analysis is to use analytical techniques to elucidate the reason for failure. Infrared spectroscopy (FTIR) - a technique commonly used for identification of organic/polymeric materials - can be useful for this purpose. The capability of the technique will be exemplified and some cases will be shown in more detail.
Keywords :
Fourier transform spectra; contamination; failure analysis; infrared spectra; organic compounds; contamination; failure analysis; functional failures; infrared spectroscopy; organic material identification; polymeric material identification; Contacts; Copper; Explosives; Magnesium; Materials; Sea surface; Surface treatment; FTIR; analysis; failure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
Type :
conf
DOI :
10.1109/ICRMS.2011.5979416
Filename :
5979416
Link To Document :
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